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Ion Beam Surface Layer Analysis

Ion Beam Surface Layer Analysis

Otto Meyer

Springer-Verlag New York Inc.
2013
nidottu
The II. International Conference on Ion Beam Surface Layer Analysis was held on September 15-19, 1975 at the Nuclear Research Center, Karlsruhe, Germany. The date fell between two related con­ ferences: "Application of Ion-Beams to Materials" at Warwick, Eng­ land and "Atomic Collisions in Solids" at Amsterdam, the Nether­ lands. The first conference on Ion Beam Surface Layer Analysis was held at Yorktown Heights, New York, 1973. The major topic of that and the present conference was the material analysis with ion beams including backscattering and channeling, nuclear reactions and ion induced X-rays with emphasis on technical problems and no­ vel applications. The increasing interest in this field was docu­ mented by 7 invited papers and 85 contributions which were presen­ ted at the meeting in Karlsruhe to about 150 participants from 21 countries. The oral presentations were followed by parallel ses­ sions on "Fundamental Aspects", "Analytical Problems" and "Appli­ cations" encouraging detailed discussions on the topics of most current interest. Summaries of these sessions were presented by the discussion leaders to the whole conference. All invited and contributed papers are included in these proceedings; summaries of the discussion sessions will appear in a separate booklet and are availble from the editors. The application of ion beams to material analysis is now well established.
Ion Beam Surface Layer Analysis

Ion Beam Surface Layer Analysis

Otto Meyer

Springer-Verlag New York Inc.
2012
nidottu
The II. International Conference on Ion Beam Surface Layer Analysis was held on September 15-19, 1975 at the Nuclear Research Center, Karlsruhe, Germany. The date fell between two related con­ ferences: "Application of Ion-Beams to Materials" at Warwick, Eng­ land and "Atomic Collisions in Solids" at Amsterdam, the Nether­ lands. The first conference on Ion Beam Surface Layer Analysis was held at Yorktown Heights, New York, 1973. The major topic of that and the present conference was the material analysis with ion beams including backscattering and channeling, nuclear reactions and ion induced X-rays with emphasis on technical problems and no­ vel applications. The increasing interest in this field was docu­ mented by 7 invited papers and 85 contributions which were presen­ ted at the meeting in Karlsruhe to about 150 participants from 21 countries. The oral presentations were followed by parallel ses­ sions on "Fundamental Aspects", "Analytical Problems" and "Appli­ cations" encouraging detailed discussions on the topics of most current interest. Summaries of these sessions were presented by the discussion leaders to the whole conference. All invited and contributed papers are included in these proceedings; summaries of the discussion sessions will appear in a separate booklet and are availble from the editors. The application of ion beams to material analysis is now well established.
Preliminary Report on the Tertiary Fossils of Alabama and Mississippi...
Preliminary Report on the Tertiary Fossils of Alabama and Mississippi... is an unchanged, high-quality reprint of the original edition of 1886. Hansebooks is editor of the literature on different topic areas such as research and science, travel and expeditions, cooking and nutrition, medicine, and other genres. As a publisher we focus on the preservation of historical literature. Many works of historical writers and scientists are available today as antiques only. Hansebooks newly publishes these books and contributes to the preservation of literature which has become rare and historical knowledge for the future.