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The Ray of Hope: Poems that help you to grow and succeed

The Ray of Hope: Poems that help you to grow and succeed

Amrit Rathi

Createspace Independent Publishing Platform
2010
nidottu
This book is full of wisdom and techniques that will help you grow and succeed. A very practical manual, it encompasses lessons in the core areas that matter the most: Peace, Love and Relationships, Work and People, and Freedom.It is not a book that just explains and prescribes what needs to be done in each of these areas-it is about changing your perspective, bringing stillness and love to your attitude, living in the present moment, enjoying your work and people, and achieving freedom from suffering and mental conditioning.You will find in this book much that you can relate to, many things of value. Perhaps certain concepts or techniques will strike you as most useful, others may seem less so, but they may be referred to in the future when required. The collection is more ' la carte' than 'set menu.' Take those teachings that work for you as an individual, where you are now, and leave the others for later.In the unique poetic format, the contents reflect simplicity and directness; you will naturally be drawn by and touched with the wonderful insights contained in this book.May you grow and succeed with this book
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X-Ray Spectroscopy in Atomic and Solid State Physics

X-Ray Spectroscopy in Atomic and Solid State Physics

Springer-Verlag New York Inc.
2011
nidottu
The fields of X-Ray Spectroscopy in Atomic and Solid State Physics have undergone spectacular growth, sometimes rather anarchic, during the past decade. The old mold of X-ray spectroscopy has been burst, and this ASI provided an in-depth exploration of theory and recently developed techniques; however, some work still needs to be done to create a new frame and reduce anarchy in the field. The purpose of this Institute was to gather atomic and solid state physicists working in theoretical and new experimental techniques recently developed. The lectures were concerned with, among others, the following fields: theory of X-ray near-edge structure, XPS and AES with conventional and synchrotron radiation sources, PIXE, EXAFS, SEXAFS, XRF, SXS, and molecular spectroscopy. The Institute considered in detail some of these experimental tech­ niques and the pertinent theoretical interpretations by selecting an important list of lectures which summarize the scientific contents of the ASI. The truly international character of this NATO ASI, its size, and the high quality of the lecturers contributed to make this school a very fruitful scientific meeting. Two to four general lectures were given each working day and three afternoons were reserved for presentation of current work in the form of posters. We think that these poster presentations reflect the current research work of the participants.
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X-Ray and Neutron Structure Analysis in Materials Science

X-Ray and Neutron Structure Analysis in Materials Science

Springer-Verlag New York Inc.
2011
nidottu
During the last few decades, crystallography has become a wide and economically important field of science with many interesting applications in materials research, in different branches of physics, chemistry, geology, pharmacology, biochemistry, electronics, in many technological processes, machinery, heavy industry, etc. Twenty Nobel prizes awarded for achieve­ ments belonging to this· field only underline its distinction. Crystallo­ graphy has become a commonly used term, but - like a whale - it is much easier to recognize than to describe because of an extreme diversity of sub­ jects involved which range from highly sophisticated theories to the develop­ ment of routine technological processes or testing of materials in produc­ tion. It is apparent that only some aspects of selected topics could be included on a single occasion. The conference "ADVANCED METHODS IN X-RAY AND NEUTRON STRUCTURE ANALYSIS OF MATERIALS" held in Karlovy Vary (Czechoslovakia) on October 5-9, 1987, was intended to cover the most important crystallographic aspects of ma­ terials science. The conference was attended by 250 people from 16 countries (Belgium,Bulgaria, China, Czechoslovakia, Finland, France, FRG, GDR, Hungary, Italy, The Netherlands, Poland, Sweden, USA, USSR and Yugoslavia).
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X-Ray Spectrometry in Electron Beam Instruments

X-Ray Spectrometry in Electron Beam Instruments

Springer-Verlag New York Inc.
2012
nidottu
From its early days in the 1950s, the electron microanalyzer has offered two principal ways of obtaining x-ray spectra: wavelength dispersive spectrometry (WDS), which utilizes crystal diffraction, and energy dispersive spectrometry (EDS), in which the x-ray quantum energy is measured directly. In general, WDS offers much better peak separation for complex line spectra, whereas EDS gives a higher collection efficiency and is easier and cheaper to use. Both techniques have undergone major transformations since those early days, from the simple focusing spectrometerand gas proportional counter of the 1950s to the advanced semiconductor detectors and programmable spectrometersoftoday. Becauseofthesedevelopments, thecapabilities and relative merits of EDS and WDS techniques have been a recurring feature of microprobeconferences for nearly40 years, and this volume bringstogetherthepapers presented at the Chuck Fiori Memorial Symposium, held at the Microbeam Analysis Society Meeting of 1993. Several themes are apparent in this rich and authoritative collection of papers, which have both a historical and an up-to-the-minute dimension. Light element analysis has long been a goal of microprobe analysts since Ray Dolby first detected K radiation with a gas proportional counter in 1960. WDS techniques (using carbon lead stearate films) were not used for this purpose until four years later. Now synthetic multilayers provide the best dispersive elements for quantitative light element analy­ sis-still used in conjunction with a gas counter.
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X-Ray and Neutron Dynamical Diffraction

X-Ray and Neutron Dynamical Diffraction

Springer-Verlag New York Inc.
2012
nidottu
This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: • the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, • the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and • X-ray and neutron interferometry.
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X-Ray Fluorescence Spectrometry (XRF) in Geoarchaeology

X-Ray Fluorescence Spectrometry (XRF) in Geoarchaeology

Springer-Verlag New York Inc.
2012
nidottu
Since the 1960s, x-ray fluorescence spectrometry (XRF), both wavelength and energy-dispersive have served as the workhorse for non-destructive and destructive analyses of archaeological materials. Recently eclipsed by other instrumentation such as LA-ICP-MS, XRF remains the mainstay of non-destructive chemical analyses in archaeology, particularly for volcanic rocks, and most particularly for obsidian. In a world where heritage and repatriation issues drive archaeological method and theory, XRF remains an important tool for understanding the human past, and will remain so for decades to come.Currently, there is no comprehensive book in XRF applications in archaeology at a time when the applications of portable XRF and desktop XRF instrumentation are exploding particularly in anthropology and archaeology departments worldwide. The contributors to this volume are the experts in the field, and most are at the forefront of the newest applications of XRF to archaeological problems. It covers all relevant aspects of the field for those using the newest XRF technologies to deal with very current issues in archaeology.
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X-Ray Line Profile Analysis in Materials Science

X-Ray Line Profile Analysis in Materials Science

Jen Gubicza

Idea Group,U.S.
2014
sidottu
X-ray line profile analysis is an effective and non-destructive method for the characterisation of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field.X-Ray Line Profile Analysis in Materials Science aims to synthesise the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.
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