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X-Ray Spectra and Chemical Binding

X-Ray Spectra and Chemical Binding

Armin Meisel; Gunter Leonhardt; Rüdiger Szargan

Springer-Verlag Berlin and Heidelberg GmbH Co. K
2011
nidottu
In the 12 years that have passed since the publication of Riintgenspektren und chemische Bindung, the original German work on which· this text is based, several aspects of high-resolution X-ray spectroscopy have devel­ oped rapidly. After accepting the suggestion of Dr. R.D. Deslattes that a translation should be prepared, we thoroughly revised the book in order to include these recent developments in theory, equipment and applications. The latest reSearch results and publications that had appeared by 1987/1988 have been taken into account in the analysis. However, as the general treatment of the German edition is still valid today, the organization of the contents did -not have to be modified. The present status of the field is adequately described just by the addition of supplementary material in the English edition. We have merely rearranged what was previously Chapter 4 into tabular form and placed it as an appendix. This presentation produces greater clarity and increases the ease with which the information can be referred to. We thank Dr. E. Kallne for undertaking the translation. We are grate­ ful to Dr. R.D. Deslattes and Dr. H. Lotsch for their conscientious and critical checking of the translation. Chapters 3 and 6 were updated by our colleague Dr. H. Sommer, to whom special thanks are due. It is our hope that this transiation and revision will make our text available to a larger section of the scientific community.
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X-Ray Microscopy

X-Ray Microscopy

Springer-Verlag Berlin and Heidelberg GmbH Co. K
2013
nidottu
X-ray microscopy fills a gap between optical and electron microscopy. Using soft x-rays, a resolution higher than with visible light can be obtained. In comparison to electron microscopy, thick, wet, unstained specimens can be examined. This is especially advantageous for biological applications. The intense synchrotron radiation of electron storage rings and the de- velopment of optical elements for soft x-rays render x-ray microscopy feasi- ble for basic research. Wider applications will be possible in the future with the development of laboratory x-ray sources and microscopes. In 1979 a conference on x-ray microscopy was organized by the New York Academy of Sciences and in 1981 a symposium on high resolution soft x-ray optics was held at Brookhaven. The present volume contains the contributions to the sympos i um "X-Ray Microscopy", organ i zed by the Akademie der Wi ssen- schaften in Gottingen in September 1983. In their capacity as conference chairmen, the editors would like to thank the Akademie der Wissenschaften, especially Prof. H.G. Wagner, Secretary of the Academy, and Mr. J. Pfahlert for organizing the symposium. We are in- debted to the Stiftung Volkswagenwerk for financial support. The symposium was held at the Max-Planck-Institut fUr Stromungsforschung. We are grateful for their hospitality and assistance during the symposium. Thanks are due to all authors and to the Springer Verlag for their combined efforts. We thank Dipl.-Phys. P. Guttmann, Dr. B. Niemann and Mrs. A. Marienhagen for their assistance during the final preparation of the manuscripts.
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X-Ray Microscopy III

X-Ray Microscopy III

Springer-Verlag Berlin and Heidelberg GmbH Co. K
2013
nidottu
The growth of interest and research activity in X -ray microscopy is reflected in the increasing size and scope of a related series of international conferences, the latest of which (XRM90) was held at King's College London (3-7 September 1990) with over 130 delegates. Previous conferences in Gottingen and Brookhaven resulted in books in the Springer Series in Optical Sciences, and this volume, the proceedings of XRM90, maintains this tradition. Because of the large number of papers their lengths were strictly limited and, while most papers can be directly identified with conference presentations, in a few cases those on similar topics by the same authors have been combined into a longer paper to allow better use of the space. The book is divided into six parts, with Parts IT-VI covering the major areas of interest at the conference. In Part 1 are two overviews; Ron Burge presented the opening paper of the conference, while the closing, summary, contrlbution by Janos Kirz is included here as a comprehensive introduction to the remainder of the book. Part IT covers developments in X -ray sources and optics. The high average brightnesses of synchrotron radiation sources have made many applications pos­ sible, while the more convenient, laboratory-based, plasma sources offer much promise for the future. Several contributions report significant advances in X-ray optics, which must clearly continue fully to exploit the latest sources.
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X-Ray Scattering from Soft-Matter Thin Films

X-Ray Scattering from Soft-Matter Thin Films

Metin Tolan

Springer-Verlag Berlin and Heidelberg GmbH Co. K
2013
nidottu
The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science. They are also very exciting with respect to fundamental questions: In thin films, liquids and polymers may be considered as trapped in a quasi-two-dimensional geometry. This confined geometry is expected to alter the properties and structures of these materials considerably. This volume is dedicated to the scattering of x-rays by soft-matter interfaces. X-ray scattering under grazing angles is the only tool to investigating these materials on atomic and mesoscopic length scales. A review of the field is presented with many examples.
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X-Ray and Neutron Reflectivity: Principles and Applications

X-Ray and Neutron Reflectivity: Principles and Applications

Jean Daillant; Alain Gibaud

Springer-Verlag Berlin and Heidelberg GmbH Co. K
2014
nidottu
The reflection of and neutrons from surfaces has existed as an x-rays exp- imental for almost it is in the last technique fifty Nevertheless, only years. decade that these methods have become as of enormously popular probes This the surfaces and interfaces. to be due to of several appears convergence of intense different circumstances. These include the more n- availability be measured orders tron and sources that can over (so reflectivity x-ray many of and the much weaker surface diffuse can now also be magnitude scattering of thin films and studied in some the detail); growing importance multil- basic the realization of the ers in both and technology research; important which in the of surfaces and and role roughness plays properties interfaces; the of statistical models to characterize the of finally development topology its and its characterization from on roughness, dependence growth processes The of and to surface scattering experiments. ability x-rays neutro4s study four five orders of in scale of surfaces over to magnitude length regardless their and also their to ability probe environment, temperature, pressure, etc. , makes these the choice for buried interfaces often probes preferred obtaining information about the microstructure of often in statistical a global surfaces, the local This is manner to complementary imaging microscopy techniques, of such studies in the literature witnessed the veritable by explosion published the last few Thus these lectures will useful for over a resource years.
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