9 tulosta hakusanalla "Scanning Electron Microscopy and X-Ray Microanalysis".
Joseph Goldstein; Dale E. Newbury; David C. Joy; Charles E. Lyman; Patrick Echlin; Eric Lifshin; Linda Sawyer; J.R. Michael · ISBN 9780306472923
Julkaistu 2003 Kieli englanti sidottu
In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the ba...
Joseph Goldstein; Dale E. Newbury; Patrick Echlin; David C. Joy; Alton D. Romig Jr.; Charles E. Lyman; Charles Fiori; Eric Lifshin · ISBN 9781461276531
Julkaistu 2011 Kieli englanti nidottu
In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of t...
Joseph Goldstein; Dale E. Newbury; Patrick Echlin; David C. Joy; Charles Fiori; Eric Lifshin · ISBN 9781461332756
Julkaistu 2013 Kieli englanti nidottu
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interac...
Joseph Goldstein; Dale E. Newbury; David C. Joy; Charles E. Lyman; Patrick Echlin; Eric Lifshin; Linda Sawyer; J.R. Michael · ISBN 9781461349693
Julkaistu 2013 Kieli englanti nidottu
In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the ba...
Joseph I. Goldstein; Dale E. Newbury; Joseph R. Michael; Nicholas W.M. Ritchie; John Henry J. Scott; David C. Joy · ISBN 9781493966745
Julkaistu 2017 Kieli englanti sidottu
This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM...
Joseph I. Goldstein; Dale E. Newbury; Joseph R. Michael; Nicholas W.M. Ritchie; John Henry J. Scott; David C. Joy · ISBN 9781493982691
Julkaistu 2018 Kieli englanti nidottu
This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM...
Patrick Echlin; C.E. Fiori; Joseph Goldstein; David C. Joy; Dale E. Newbury · ISBN 9781475790290
Julkaistu 2013 Kieli englanti nidottu
This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 197...
Patrick Echlin · ISBN 9780387857305
Julkaistu 2009 Kieli englanti sidottu
Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instrument...
Patrick Echlin · ISBN 9781441946744
Julkaistu 2010 Kieli englanti nidottu
Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instrument...