Kirjahaku

Written by a pioneer in the field, this text provides a complete introduction to x-ray microscopy, providing all of the technical background required to use, understand and even develop x-ray microscopes. Starting from the basics of x-ray physics and focusing optics, it goes on to cover imaging theory, tomography, chemical and elemental analysis, lensless imaging, computational methods, instrumentation, radiation damage, and cryomicroscopy, and includes a survey of recent scientific applications. Designed as a 'one-stop' text, it provides a unified notation, and shows how computational methods in different areas are linked with one another. Including numerous derivations, and illustrated with dozens of examples throughout, this is an essential text for academics and practitioners across engineering, the physical sciences and the life sciences who use x-ray microscopy to analyze their specimens, as well as those taking courses in x-ray microscopy.

Originally published in 1960 as part of the Cambridge Monographs on Physics series, this book looks at the physical principles behind the use of X-rays for microscopic investigation. Cosslett and Nixon review a variety of techniques used in X-ray microscopy, as well as specimen preparation methods. Many plates of various X-rayed materials are also included. This book will be of value to anyone with an interest in the history of microscopy.

In 1979, a conference on x-ray microscopy was organized by the New York Academy of Sciences, and in 1983, the Second Interna­ tional Symposium on X-ray Imaging was organized by the Akademie der Wissenschaften in Gottingen, Federal Republic of Germany. This volume contains the contributions to the symposium "X-ray Microscopy '86", held in Taipei, Taiwan, the Republic of China in August 1986. This is the first volume which intends to provide up-to­ date information on x-ray imaging to biologists, therefore, emphasis was given to specimen preparation techniques and image interpreta­ tion. Specimen preparation represents a major part of every microscopy work, therefore, it should be strongly emphasized in this emerging field of x-ray microscopy. Theoretically, x-ray microscopy offers the potential for the study of unfixed, hydrated biological ma­ terials. Since very few biological system can be directly observed without specimen preparation, we would like to emphasize that new information on biological specimens can only be obtained if the speci­ men is properly prepared. In the past decade, many of the published x-ray images were obtained from poorly prepared biological speci­ mens, mainly air-dried materials. Therefore, one of the goals of this conference is to bring the importance of specimen preparation to the attention of x-ray microscopy community. X-ray microscopy can be subdivided into several major areas. They are the classic x-ray projection microscope, x-ray contact imag­ ing (microradiography) and the more recent x-ray scanning micro­ scope, x-ray photoelectron microscope and x-ray imaging microscope.

X-ray microscopy fills a gap between optical and electron microscopy. Using soft x-rays, a resolution higher than with visible light can be obtained. In comparison to electron microscopy, thick, wet, unstained specimens can be examined. This is especially advantageous for biological applications. The intense synchrotron radiation of electron storage rings and the de- velopment of optical elements for soft x-rays render x-ray microscopy feasi- ble for basic research. Wider applications will be possible in the future with the development of laboratory x-ray sources and microscopes. In 1979 a conference on x-ray microscopy was organized by the New York Academy of Sciences and in 1981 a symposium on high resolution soft x-ray optics was held at Brookhaven. The present volume contains the contributions to the sympos i um "X-Ray Microscopy", organ i zed by the Akademie der Wi ssen- schaften in Gottingen in September 1983. In their capacity as conference chairmen, the editors would like to thank the Akademie der Wissenschaften, especially Prof. H.G. Wagner, Secretary of the Academy, and Mr. J. Pfahlert for organizing the symposium. We are in- debted to the Stiftung Volkswagenwerk for financial support. The symposium was held at the Max-Planck-Institut fUr Stromungsforschung. We are grateful for their hospitality and assistance during the symposium. Thanks are due to all authors and to the Springer Verlag for their combined efforts. We thank Dipl.-Phys. P. Guttmann, Dr. B. Niemann and Mrs. A. Marienhagen for their assistance during the final preparation of the manuscripts.

This book is based on presentations to the International Conference of X-Ray Micro­ scopy and Spectromicroscopy, XRM 96, which took place in Wiirzburg, August 19- 23, 1996. The conference also celebrated the lOOth anniversary of the discovery of X­ rays by Wilhelm Conrad Rontgen on November 8, 1895, in Wiirzburg. This book contains state-of-the-art reviews and up-to-date progress reports in the field of X-ray microscopy and spectromicroscopy, including related new X-ray optics and X-ray sources. It reflects the lively activities within a relatively new field of science which combines the development of new instruments and methods with their applications to numerous topical scientific questions. The applications range from biological and medical topics, colloid physics, and soil sciences to solid-state physics, material sciences, and surface sciences. Their variety demonstrates the interdisci­ plinary and cooperative character of this field and the growing demand for micro­ scopic and spectromicroscopic information on the nanometer scale and under specific sample conditions, for example in wet (natural) surroundings or on a solid surface.

The growth of interest and research activity in X -ray microscopy is reflected in the increasing size and scope of a related series of international conferences, the latest of which (XRM90) was held at King's College London (3-7 September 1990) with over 130 delegates. Previous conferences in Gottingen and Brookhaven resulted in books in the Springer Series in Optical Sciences, and this volume, the proceedings of XRM90, maintains this tradition. Because of the large number of papers their lengths were strictly limited and, while most papers can be directly identified with conference presentations, in a few cases those on similar topics by the same authors have been combined into a longer paper to allow better use of the space. The book is divided into six parts, with Parts IT-VI covering the major areas of interest at the conference. In Part 1 are two overviews; Ron Burge presented the opening paper of the conference, while the closing, summary, contrlbution by Janos Kirz is included here as a comprehensive introduction to the remainder of the book. Part IT covers developments in X -ray sources and optics. The high average brightnesses of synchrotron radiation sources have made many applications pos­ sible, while the more convenient, laboratory-based, plasma sources offer much promise for the future. Several contributions report significant advances in X-ray optics, which must clearly continue fully to exploit the latest sources.

This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987. Previous recent symposia on the sub­ ject were held in New York in 1979, Gottingen in 1983 and Taipei in 1986. Developments in x-ray microscopy continue at a rapid pace, with im­ portant advances in all major areas: x-ray sources, optics and components, and microscopes and imaging systems. Taken as a whole, the work pre­ sented here emphasizes three major directions: (a) improvements in the capability and image-quality of x-ray microscopy, expressed principally in systems attached to large, high-brightness x-ray sources; (b) greater access to x-ray microscopy, expressed chiefly in systems employing small, often pulsed, x-ray sources; and (c) increased rate of exploration of applications of x-ray microscopy. The number of papers presented at the symposium has roughly dou­ bled compared with that of its predecessors. While we are delighted at this growth as a manifestation of vitality and rapid growth of the field, we did have to ask the authors to limit the length of their papers and to submit them in camera-ready form. We thank the authors for their con­ tributions and for their efforts in adhering to the guidelines on manuscript preparation.