This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners — engineers, technicians, physical and biological scientists, clinicians, and technical managers — will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope’s software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD).With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a "dual beam" platform incorporating bothelectron and ion columns allows precision modification of the specimen by focused ion beam milling. New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal.Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managersEmphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful resultsProvides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurementsMakes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation.Includes case studies to illustrate practical problem solvingCovers Helium ion scanning microscopyOrganized into relatively self-contained modules – no need to "read it all" to understand a topicIncludesan online supplement—an extensive "Database of Electron–Solid Interactions"—which can be accessed on SpringerLink, in Chapter 3
This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners — engineers, technicians, physical and biological scientists, clinicians, and technical managers — will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope’s software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD).With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a "dual beam" platform incorporating bothelectron and ion columns allows precision modification of the specimen by focused ion beam milling. New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal.Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managersEmphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful resultsProvides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurementsMakes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation.Includes case studies to illustrate practical problem solvingCovers Helium ion scanning microscopyOrganized into relatively self-contained modules – no need to "read it all" to understand a topicIncludesan online supplement—an extensive "Database of Electron–Solid Interactions"—which can be accessed on SpringerLink, in Chapter 3
Gary Cecchine; Richard E. Darilek; Margaret C. Harrell; Michael Mattock; Shelly Culbertson; David S. Ortiz; Nicholas W. Maynard; S. R. Bohandy; Edward Balkovich; Bruce Nardulli
I wish you all the best in your publishing venture, which I'm sure will bring back fond memories for many industry-people and regular air-travelers alike. Mr. Nils J. Flo, Director, Public Relations Scandinavian Airlines System I am sending you an interesting brochure of our current fleet....Your book sounds most interesting, and I am looking forward to receiving a copy. Mr. Richard A. Swift, Sales Manager AEROFLOT Enclosed you will find Northwest's Route Map, along with photos of both the 747-200, and 747-400. Regretfully, a photo of the DC-7 is not available at this time ... I hope these materials assist you in the completion of your book. I am looking forward to viewing the end result. Mr. Jon Austin, Director, Media Relations Northwest Airlines Enclosed please find photos of our MD-11, and 747 jets.... I would certainly be appreciated if you could supply us with a copy of your book, which will be kept in our library. Wishing you all success. Claudie F. Warshawer, Coordinator, Industry Relations, U.S. and Canada, VARIG, Brazilian Airlines We never operated DC-7s. But I have enclosed a photo of a C-54, and also a B-747....We are looking forward to your book. it is history that should be recorded. Mr. J. Baker, Historical Committee Flying Tiger Retirement Club Dean Nichols was born on the Yakima Indian Reservation in Washington in 1919, although his Indian forebears lived in northern Maine. A licensed tugboat captain and purser, he has worked as a port manager, an electrical and civil engineer, an air-traffic controller, a boat officer for the Alaska Department of Fish and Game, and a marine-traffic officer for the Alaska Marine Highway. He followed in his father's footsteps to become a tugboat captain in the Pacific Northwest. He has studied the social and natural sciences, humanities, and business administration at Anchorage Community College.
A sloppy attempt to assassinate a wealthy businessman, a stockbroker looking more like an outlaw biker, and the unlikely situation of a vampire with a taste for geriatric blood are some of the many puzzles Jimmy Warren, P.I. is called upon to solve. And then there's that irritating, ankle-biting, blue-haired dog
Matt Aitkenhead; B. Sailaja; Ch. Padmavathi; D. Krishnaveni; G. Katti; D. Subrahmanyam; M. S. Prasad; S. Gayatri; S. R. Voleti; Oliver Körner; Nicolas Tremblay; Clyde W. Fraisse; Norman E. Breuer; Victor Cabrera
This collection features five peer-reviewed literature reviews on decision support systems (DSS) in agriculture.The first chapter provides a review of DSS in agriculture, whilst addressing the key questions surrounding their use for farm soil and crop management. The different aspects of agricultural DSS design, implementation and operation are also discussed.The second chapter assesses the role of DSS for pest monitoring and management through information technology such as, remote sensing, GIS, spectral indices, image-based diagnostics, and phenology-based degree day models.The third chapter discusses the potential of implementing DSS within the growing mechanisation in greenhouses. It examines differences in development and application of deterministic explanatory and data-based models for real-time control and DSS.The fourth chapter explores the key issues associated with deploying DSS in precision agriculture, whilst also considering their human and social aspects. The chapter also considers how future research on DSS can be moulded to improve productivity in a precision agriculture setting.The final chapter outlines the importance of a participatory approach in DSS development, whilst also offering examples of climate-based DSS for crop and land management, pest and disease management, and livestock (dairy) management.
