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Kirjailija

Gracieli Posser

Kirjat ja teokset yhdessä paikassa: 2 kirjaa, julkaisuja vuosilta 2016-2018, suosituimpien joukossa Electromigration Inside Logic Cells. Vertaile teosten hintoja ja tarkista saatavuus suomalaisista kirjakaupoista.

2 kirjaa

Kirjojen julkaisuhaarukka 2016-2018.

Electromigration Inside Logic Cells

Electromigration Inside Logic Cells

Gracieli Posser; Sachin S. Sapatnekar; Ricardo Reis

Springer International Publishing AG
2018
nidottu
This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. They show in this book that an interconnect inside a cell can fail reducing considerably the circuit lifetime and they demonstrate a methodology to optimize the lifetime of circuits, by placing the output, Vdd and Vss pin of the cells in the less critical regions, where the electromigration effects are reduced. Readers will be enabled to apply this methodology only for the critical cells in the circuit, avoiding impact in the circuit delay, area and performance, thus increasing the lifetime of the circuit without loss in other characteristics.
Electromigration Inside Logic Cells

Electromigration Inside Logic Cells

Gracieli Posser; Sachin S. Sapatnekar; Ricardo Reis

Springer International Publishing AG
2016
sidottu
This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. They show in this book that an interconnect inside a cell can fail reducing considerably the circuit lifetime and they demonstrate a methodology to optimize the lifetime of circuits, by placing the output, Vdd and Vss pin of the cells in the less critical regions, where the electromigration effects are reduced. Readers will be enabled to apply this methodology only for the critical cells in the circuit, avoiding impact in the circuit delay, area and performance, thus increasing the lifetime of the circuit without loss in other characteristics.