Kirjojen hintavertailu. Mukana 12 595 353 kirjaa ja 12 kauppaa.

Kirjailija

Harald Gossner

Kirjat ja teokset yhdessä paikassa: 3 kirjaa, julkaisuja vuosilta 2003-2026, suosituimpien joukossa High Current ESD. Vertaile teosten hintoja ja tarkista saatavuus suomalaisista kirjakaupoista.

3 kirjaa

Kirjojen julkaisuhaarukka 2003-2026.

High Current ESD

High Current ESD

Charvaka Duvvury; Harald Gossner; Mayank Shrivastava

Cambridge University Press
2026
sidottu
Synthesizing experience from industry and academia, this book offers a comprehensive and nuanced perspective on the Physics of Electrostatic Discharge (ESD) phenomena in a range of semiconductor device technologies, illustrating robust design practices. Starting with fundamental insights into high-current ESD behaviour in semiconductor devices, it gradually builds toward practical design principles and real-world reliability challenges in advanced CMOS, FinFETs, GaN HEMTs, carbon nanostructures and TFT technologies. Device-level physics and practical design implications are explored throughout, bridging the gap between deep theoretical understanding and real-world design constraints. Including unique simulation techniques alongside experimental results, this book thoroughly explores core ESD design principles. Including multiple curated case studies, this book will equip readers with all the tools needed to address current ESD design challenges and embrace covers the challenges of the future. A reliable and thought-provoking exploration, ideal for graduate students, industry professionals and researchers working in device physics, design, and reliability.
ESD Industry Council System Level White Paper III Archive: Common Misconceptions and System Efficient ESD Design Recommendations
Over the last twenty years, an increasing misconception between system level designers (OEMs) and semiconductor component (IC) providers has become very apparent relating to three specific ESD issues: ESD test specification requirements of system vs. IC providers;Understanding of ESD failures in terms of physical failure and system upset and what causes these failures in terms of system level and IC level constraints;Lack of acknowledged responsibility between system designers and IC providers regarding proper system level ESD design.In White Paper 1 from the Industry Council on ESD Target Levels, which presented a paradigm shift in the realistic and safe IC level ESD requirements, we introduced the importance of separately addressing the system specific and IC specific ESD issues. In White Paper 3 we present the first comprehensive analysis of system ESD understanding including ESD related system failures, and design for system robustness. The main purpose of the present document is to close the existing communication gap between the OEMs and IC providers by involving the expertise from OEMs and system design experts. This will be accomplished by what we describe in this document as "System-Efficient ESD Design" (SEED) which promotes a common IC / OEM understanding of the correct system level ESD needs. White paper 3 will be constructed of two parts. A key finding of Part I of the white paper is the development of a framework for sharing IC / system level circuit information so that best practice ESD protection and controls can be co-developed and properly shared.Later, in Part II of White Paper 3, the Industry Council will use the information in Part I to establish recommendations for IC and system level manufacturers regarding proper protection, proper controls and best practice ESD tests, which can properly assess ESD and related EMI performance of system level tests. The purpose of White Paper 3, Part II will be to better define the ESD relationship between IC manufacturers and system level OEMs and their respectiveresponsibilities.
Simulation Methods for ESD Protection Development

Simulation Methods for ESD Protection Development

Harald Gossner; Kai Esmark; Wolfgang Stadler

Elsevier Science Ltd
2003
sidottu
Simulation Methods for ESD Protection Development looks at the integration of new techniques into a comprehensive development flow, which is now available due advances made in the field during the recent years. These findings allow for an early, stable ESD concept at a very early stage of the technology development, which is essential now development cycles have been reduced. The book also offers ways of increasing the optimization and control of the technology concerning performance, thus making the process more cost effective and increasingly efficient. This title provides a guide through the latest research and technology presenting the ESD protection development methodology. This is based on a combination of process, device and circuit stimulation, and addresses the optimization of the industry critical issue, reduced development cycles.Written to address the needs of the ESD engineer, this text is required reading by all industry practitioners and researchers and students within this field.