Matthias Wuttig

This is an overview of recording principles, materials aspects, and applications of rewritable optical storage. Elements of data recording, including mark formation, eraseability, direct overwrite strategies, data quality and data stability are explained and extensively discussed. Throughout the book, a mark formation model is described and used to back-up measurement results and support the discussed applications. High-speed and dual-layer recording are analyzed in depth, with proposals to achieve higher performance.

Ultrathin metal films have great potential for applications in areas such as magnetic sensors, recording materials, and novel devices such as spin filters or transistors. This research monograph discusses the close correlation between the magnetic and structural properties of thin films in the context of numerous examples of epitaxial metal films, while emphasis is laid on the stabilization of novel structures compared to the bulk material. Further options, possibilities, and limits for applications are given. Techniques for the characterization of thin films are addressed as well.

This is an overview of recording principles, materials aspects, and applications of rewritable optical storage. Elements of data recording, including mark formation, eraseability, direct overwrite strategies, data quality and data stability are explained and extensively discussed. Throughout the book, a mark formation model is described and used to back-up measurement results and support the discussed applications. High-speed and dual-layer recording are analyzed in depth, with proposals to achieve higher performance.

Ultrathin metal films have great potential for applications in areas such as magnetic sensors, recording materials, and novel devices such as spin filters or transistors. This research monograph discusses the close correlation between the magnetic and structural properties of thin films in the context of numerous examples of epitaxial metal films, while emphasis is laid on the stabilization of novel structures compared to the bulk material. Further options, possibilities, and limits for applications are given. Techniques for the characterization of thin films are addressed as well.