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Kirjailija

Thomas F. Kelly

Kirjat ja teokset yhdessä paikassa: 5 kirjaa, julkaisuja vuosilta 2013-2022, suosituimpien joukossa We Can Do More and Better With Less: Education Reform Can Work. Vertaile teosten hintoja ja tarkista saatavuus suomalaisista kirjakaupoista.

5 kirjaa

Kirjojen julkaisuhaarukka 2013-2022.

Atomic-Scale Analytical Tomography

Atomic-Scale Analytical Tomography

Thomas F. Kelly; Brian P. Gorman; Simon P. Ringer

Cambridge University Press
2022
sidottu
A comprehensive guide on Atomic-Scale Analytical Tomography (ASAT) that discusses basic concepts and implications of the technique in areas such as material sciences, microscopy, engineering sciences and several interdisciplinary avenues. The title interrogates how to successfully achieve ASAT at the intersection of transmission electron microscopy and atom probe microscopy. This novel concept is capable of identifying individual atoms in large volumes as well as in 3D, with high spatial resolution. Written by leading experts from academia and industry, this book serves as a guide with real-world applications on cutting-edge research problems. An essential reading for researchers, engineers and practitioners interested in nanoscale characterisation, this book introduces the reader to a new direction for atomic-scale microscopy.
We Can Do More and Better With Less: Education Reform Can Work
We are currently a nation of underachievers. This book describes in detail how we can move from our present disfunctionally designed 19th Century school system to a 21st-century system designed to deliver high achievement for all students. The present system is failing all students in terms of learning to their true ability levels. We can eliminate the achievement gap between races, genders and economic classes and do it all with existing resources or less. This is a win - win - win book. Students win, teachers win, parents and taxpayers win. Money is not the problem. How we spend money is.
We Can Do More and Better With Less: Education Reform Can Work
We are currently a nation of underachievers. This book describes in detail how we can move from our present disfunctionally designed 19th Century school system to a 21st-century system designed to deliver high achievement for all students. The present system is failing all students in terms of learning to their true ability levels. We can eliminate the achievement gap between races, genders and economic classes and do it all with existing resources or less. This is a win - win - win book. Students win, teachers win, parents and taxpayers win. Money is not the problem. How we spend money is.
Local Electrode Atom Probe Tomography

Local Electrode Atom Probe Tomography

David J. Larson; Ty J. Prosa; Robert M. Ulfig; Brian P. Geiser; Thomas F. Kelly; Professor Sir Colin J. Humphreys

Springer-Verlag New York Inc.
2016
nidottu
This book is the first, single-source guide to successful experiments using the local electrode atom probe (LEAP®) microscope. Coverage is both comprehensive and user friendly, including the fundamentals of preparing specimens for the microscope from a variety of materials, the details of the instrumentation used in data collection, the parameters under which optimal data are collected, the current methods of data reconstruction, and selected methods of data analysis. Tricks of the trade are described that are often learned only through trial and error, allowing users to succeed much more quickly in the challenging areas of specimen preparation and data collection. A closing chapter on applications presents selected, state-of-the-art results using the LEAP microscope.
Local Electrode Atom Probe Tomography

Local Electrode Atom Probe Tomography

David J. Larson; Ty J. Prosa; Robert M. Ulfig; Brian P. Geiser; Thomas F. Kelly; Professor Sir Colin J. Humphreys

Springer-Verlag New York Inc.
2013
sidottu
This book is the first, single-source guide to successful experiments using the local electrode atom probe (LEAP®) microscope. Coverage is both comprehensive and user friendly, including the fundamentals of preparing specimens for the microscope from a variety of materials, the details of the instrumentation used in data collection, the parameters under which optimal data are collected, the current methods of data reconstruction, and selected methods of data analysis. Tricks of the trade are described that are often learned only through trial and error, allowing users to succeed much more quickly in the challenging areas of specimen preparation and data collection. A closing chapter on applications presents selected, state-of-the-art results using the LEAP microscope.